钾膨胀石墨层间化合物(K-EGIC_S)的电阻率测量
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P579

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国家自然科学基金资助项目! (5 95 72 0 2 2 )


The Resistivity Measurement of Potassium-Expanded Graphite Intercalation Compounds (K-EGIC_S)
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    摘要:

    在低温惰性条件下合成的钾膨胀石墨层间化合物 (K_EGICS)的电学性能与膨胀石墨的电学性能完全相反 ,随着温度的升高 ,K_EGICS 的电阻率逐渐升高 ,电导率逐渐降低。这一现象是由客体材料钾自身的结构及其与膨胀石墨化合时的键性决定的。

    Abstract:

    This paper has described a method for synthesizing the potassium_expanded graphite intercalation compounds (K_EGICS), and discussed the electronic characteristics of expanded graphite and K_EGICS. It is found that electrical conductivity of K_EGICSgets smaller with the rising temperature (the electric conductivity decreases from 5.05×101S·cm-1to 2.35×101 S·cm-1when temperature rises from 77 K to 577 K), together with the elevation of graphite s EC (the electric conductivity goes up from 2.48×102S·cm-1to 5.769×102S·cm-1). The probable reasons for differences between expanded graphite and K_EGICSare also investigated.

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孔洪亮,陈代璋,曾荣树,2001,钾膨胀石墨层间化合物(K-EGIC_S)的电阻率测量[J].岩石矿物学杂志,20(2):167~170. KONG Hong-liang, CHEN Dai-zhang, ZENG Rong-shu,2001,The Resistivity Measurement of Potassium-Expanded Graphite Intercalation Compounds (K-EGIC_S)[J]. Acta Petrologica et Mineralogica,20(2):167~170.

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